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008 050202s2005 maua b 001 0 eng
010 _a 2005042810
015 _aGBA560485
_2bnb
015 _abnb
016 7 _a013255565
_2Uk
016 7 _a101258926
_2DNLM
020 _a0262122774 (alk. paper)
020 _a0262621967 (pbk. : alk. paper)
035 _a(OCoLC)ocm57574045
040 _aDLC
_cDLC
_dYDX
_dUKM
_dBAKER
_dCUX
_dMUQ
_dYUS
_dIXA
_dNLM
_dDLC
042 _apcc
050 0 0 _aQP376.5
_b.L83 2005
060 0 0 _a2005 L-791
060 1 0 _aWL 102
_bL941i 2005
082 0 0 _a617.886 LUC
_222
100 1 _aLuck, Steven J.
_q(Steven John),
_d1963-
245 1 3 _aAn introduction to the event-related potential technique /
_cSteven J. Luck.
260 _aCambridge, Mass. :
_bMIT Press,
_cc2005.
300 _axii, 374 p. :
_bill. ;
_c23 cm.
440 0 _aCognitive neuroscience
504 _aIncludes bibliographical references (p. [343]-355) and index.
505 _aPreface // Acknowledgments / an introduction to event related potentials and their neural origins // the design and interpretation of ERP experiments // Basic principles of ERP recording // averaging artifact rejection and artifact correction // Filtering // Plotting, measurement and analysis // ERP localization // Setting up an ERP lab // Appendix // Notes // References // Index //
650 0 _aEvoked potentials (Electrophysiology)
650 1 2 _aEvoked Potentials.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2ddc
_cSTS