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Advances in electronic testing : (Record no. 4917)

MARC details
000 -LEADER
fixed length control field	04264cam a22003497a 4500
001 - CONTROL NUMBER
control field	14356225
003 - CONTROL NUMBER IDENTIFIER
control field	OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field	20191223153322.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	060427s2006 ne a b 001 0 eng d
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number	2006274841
016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER
Record control number	977468143
Source	GyFmDB
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number	0387294082 (hd.bd. : acidfree paper)
035 ## - SYSTEM CONTROL NUMBER
System control number	(OCoLC)ocm63514329
040 ## - CATALOGING SOURCE
Original cataloging agency	OHX
Transcribing agency	OHX
Modifying agency	BAKER
--	FDA
--	DLC
042 ## - AUTHENTICATION CODE
Authentication code	lccopycat
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number	TK7867
Item number	.A385 2006
072 #7 - SUBJECT CATEGORY CODE
Subject category code	TK
Source	lcco
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number	621.381 5 GIZ
Edition number	22
245 00 - TITLE STATEMENT
Title	Advances in electronic testing :
Remainder of title	challenges and methodologies /
Statement of responsibility, etc.	edited by Dimitris Gizopoulos.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.	Dordrecht :
Name of publisher, distributor, etc.	Springer,
Date of publication, distribution, etc.	c2006.
300 ## - PHYSICAL DESCRIPTION
Extent	xxi, 412 p. :
Other physical details	ill. (some col.) ;
Dimensions	25 cm.
440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE
Title	Frontiers in electronic testing ;
Volume/sequential designation	27
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note	Includes bibliographical references and index.
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note	Foreword<br/>by Vishwani D. Agrawal Preface<br/>by Dimitris Gizopoulos Contributing Authors Dedication Chapter 1-Defect-Oriented Testing<br/>by Robert C. Aitken 1.1 History of Defect-Oriented Testing 1.2 Classic Defect Mechanisms 1.3 Defect Mechanisms in Advanced Technologies 1.4 Defects and Faults 1.5 Defect-Oriented Test Types 1.6 Experimental Results 1.7 Future Trends and Conclusions Acknowledgments References Chapter 2-Failure Mechanisms and Testing in Nanometer Technologies<br/>by Jaume Segura, Charles Hawkins and Jerry Soden 2.1 Scaling CMOS Technology 2.2 Failure Modes in Nanometer Technologies 2.3 Test Methods for Nanometer ICs 2.4 Conclusion References Chapter 3-Silicon Debug<br/>by Doug Josephson and Bob Gottlieb 3.1 Introduction 3.2 Silicon Debug History 3.3 Silicon Debug Process 3.4 Debug Flow 3.5 Circuit Failures 3.6 A Case Study in Silicon Debug 3.7 Future Challenges for Silicon Debug 3.8 Conclusion Acknowledgements References Chapter 4-Delay Testing<br/>by Adam Cron 4.1 Introduction 4.2 Delay Test Basics 4.3 Test Application 4.4 Delay Test Details 4.5 Vector Generation 4.6 Chip Design Constructs 4.7 ATE Requirements 4.8 Conclusions: Tests vs. Defects Acknowledgements References Chapter 5-High-Speed Digital Test Interfaces<br/>by Wolfgang Maichen 5.1 New Concepts 5.2 Technology and Design Techniques 5.3 Characterization and Modeling 5.4 Outlook References Chapter 6-DFT-Oriented, Low-Cost Testers<br/>by Al Crouch and GeirEide 6.1 Introduction 6.2 Test Cost - the Chicken and the Low Cost Tester 6.3 Tester Use Models 6.4 Why and When is DFT Low Cost? 6.5 What does Low Cost have to do with the Tester? 6.6 Life, the Universe, and Everything References Recommended Reading Chapter 7-Embedded Cores and System-on-Chip Testing<br/>by Rubin Parekhji 7.1 Embedded Cores and SOCs 7.2 Design and Test Paradigm with Cores and SOCs 7.3 DFT for Embedded Cores and SOCs 7.4 Test Access Mechanisms 7.5 ATPG for Embedded Cores and SOCs 7.6 SOC Test Modes 7.7 Design for At-speed Testing 7.8 Design for Memory and Logic BIST 7.9 Conclusion Acknowledgements References Chapter 8-Embedded Memory Testing<br/>by R. Dean Adams 8.1 Introduction 8.2 The Memory Design Under Test 8.3 Memory Faults 8.4 Memory Test Patterns 8.5 Self Test 8.6 Advanced Memories & Technologies 8.7 Conclusions References Chapter 9-Mixed-Signal Testing and DfT<br/>by Stephen Sunter 9.1 A Brief History 9.2 The State of the Art 9.3 Advances in the Last 10 Years 9.4 Emerging Techniques and Directions 9.5 EDA Tools for Mixed-Signal Testing 9.6 Future Directions References Chapter 10-RF Testing<br/>by Randy Wolf, Mustapha Slamani, John Ferrario and Jayendra Bhagat 10.1 Introduction 10.2 Testing RF ICs 10.3 RF Test Cost Reduction Factors 10.4 Test Hardware 10.5 Hardware Development Process 10.6 High Frequency Simulation Tools 10.7 Device Under Test Interface 10.8 Conclusions Acknowledgements References Chapter 11-Loaded
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Electronic circuits
General subdivision	Testing.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name	Gizopoulos, Dimitris.
856 42 - ELECTRONIC LOCATION AND ACCESS
Materials specified	Publisher description
Uniform Resource Identifier	<a href="http://www.loc.gov/catdir/enhancements/fy0663/2006274841-d.html">http://www.loc.gov/catdir/enhancements/fy0663/2006274841-d.html</a>
856 41 - ELECTRONIC LOCATION AND ACCESS
Materials specified	Table of contents only
Uniform Resource Identifier	<a href="http://www.loc.gov/catdir/enhancements/fy0823/2006274841-t.html">http://www.loc.gov/catdir/enhancements/fy0823/2006274841-t.html</a>
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a	7
b	cbc
c	copycat
d	2
e	ncip
f	20
g	y-gencatlg
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme	Dewey Decimal Classification
Koha item type	Stack text books

Holdings
Withdrawn status	Lost status	Source of classification or shelving scheme	Damaged status	Not for loan	Collection code	Home library	Current library	Date acquired	Total Checkouts	Full call number	Barcode	Date last seen	Price effective from	Koha item type
		Dewey Decimal Classification			97/1	All India Institute of Speech and Hearing	All India Institute of Speech and Hearing	23/12/2019		621.381 5 GIZ	14678	23/12/2019	23/12/2019	Stack text books